International Journal of Metrology and Quality Engineering

Open Access

Developing a lean measurement system to enhance process improvement p. 145

P. Lewis and G. Cooke

Published online: 06 March 2014

DOI: https://doi.org/10.1051/ijmqe/2013058

• Abstract
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Open Access

Visual tolerance analysis for engineering optimization p. 153

W. Zhou Wei, M. Moore and F. Kussener

Published online: 06 March 2014

DOI: https://doi.org/10.1051/ijmqe/2013056

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Open Access

Assessing measurement uncertainty in CMM measurements: comparison of different approaches p. 163

S. Ruffa, G.D. Panciani, F. Ricci and G. Vicario

Published online: 06 March 2014

DOI: https://doi.org/10.1051/ijmqe/2013057

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Open Access

Multivariate SPC for total inertial tolerancing p. 169

M. Pillet, A. Boukar, E. Pairel, B. Rizzon, N. Boudaoud and Z. Cherfi

Published online: 06 March 2014

DOI: https://doi.org/10.1051/ijmqe/2013055

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Open Access

The role of measurement and modelling of machine tools in improving product quality p. 177

A.P. Longstaff, S. Fletcher, S. Parkinson and A. Myers

Published online: 06 March 2014

DOI: https://doi.org/10.1051/ijmqe/2013054

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Open Access

Uncertainty inherent in empirical fitting of distributions to experimental data p. 185

G. Barbato, G. Genta and R. Levi

Published online: 06 March 2014

DOI: https://doi.org/10.1051/ijmqe/2013053

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Open Access

Performance study of dimensionality reduction methods for metrology of nonrigid mechanical parts p. 193

H. Radvar-Esfahlan and S.-A. Tahan

Published online: 06 March 2014

DOI: https://doi.org/10.1051/ijmqe/2013051

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Open Access

Average outgoing quality of calibration Lab facilities p. 201

M. A. Al Reeshi and Q. Yang

Published online: 06 March 2014

DOI: https://doi.org/10.1051/ijmqe/2013052

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Open Access

Static temperature analysis and compensation of MEMS gyroscopes p. 209

Q.J. Tang, X.J. Wang, Q.P. Yang and C.Z. Liu

Published online: 06 March 2014

DOI: https://doi.org/10.1051/ijmqe/2013059

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Open Access

The yield estimation of semiconductor products based on truncated samples p. 215

K. Gu, X.Z. Jia, H.L. You and T. Liang

Published online: 06 March 2014

DOI: https://doi.org/10.1051/ijmqe/2013050

• Abstract
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