Editorial board
Editor-in-Chief
Dr. A. CHARKI
University of Angers, France
Associate Editors
G. ABDUL-NOUR
Quebec University, Canada
G. BONNIER
Bonnier Consulting, France
Dr. P. BRIGGS
PTA, Australia
A. FORBES
National Physical Laboratory (NPL), UK
Prof. Dr. Ing. J. HOFFMANN
University of Applied Sciences of Osnabrueck, Germany
W. LOUW
NMISA, South Africa
M. NOGUEIRA FROTA
PUC-Rio, Rio de Janeiro, Brazil
Dr. F. PAVESE
National Institute of Metrological Research, Italy
Dr. D.R. PRAJAPATI
PEC University of Technology, Chandigarh, India
Dr. Q. YANG
Brunel University London, UK
Editorial Board
Dr. M.G. AHMED
National Institute of Standards, Egypt
Dr. P. BANERJEE
Amity University, Uttar Pradesh, India
Dr. D. BIGAUD
University of Angers, France
G. CALCHERA
CIRAD, France
D. COLEMAN
Alcoa Technical Center, USA
Dr. S. COLEMAN
University of Newcastle, UK
R. J. DARODA
National Institute of Metrology, Standardization and Industrial Quality, Brazil
Dr. E.A. ELSAYED
Rutgers University, USA
Alaaeldin A. ELTAWIL
NIS, Egypt
Dr. E. FREDERIKSEN
Ex-Brüel & Kjaer, Denmark
S. GHORBANI
Rutgers University, USA
Dr. T.N. GOH
National University of Singapore, Singapore
Dr. M. HAKKARAINEN
KTH Royal Institute of Technology, Sweden
Prof. C. R. HALL BARBOSA
PUC-Rio, Rio de Janeiro, Brazil
Dr. M. HIMBERT
LNE-INM/CNAM, France
Dr. M. HOSOKAWA
National Institute of Information and Communications Technology, Japan
Dr. K. JEONG-HWAN
Korea Research Institute of Standards and Sciences (KRISS), Republic of Korea
Dr. W. JIANG
Hong Kong University of Science & Technology, China
Dr. I. KOCAS
UME-TUBITAK, Turkey
Dr. N. LABAT
IMS, France
D. LOUVEL
Mettler-Toledo, Switzerland
Prof. E. C. MONTEIRO
PUC-Rio, Rio de Janeiro, Brazil
S. NAM PARK
South Korea
Dr. P. NARANG
National Metrology Institute of Australia (NMIA), Australia
Pr. M. PILLET
Université de Savoie Mont Blanc- Laboratoire SYMME, Annecy le Vieux, France
Dr. A. POPESCU
National Insitute of Metrology, Romania
L. SAINTIS
Institut des Sciences et Techniques de l'Ingénieur d'Angers - ISTIA, France
Dr. P. SCOTT
University of Huddersfield, UK
Dr. J.-P. SENELAER
ESM Mines of Douai, France
M-F. THEVENON
CIRAD, France
K. SUNG-WON
South Korea
Dr. K. TAE-WEON
Korea Research Institute of Standards and Sciences (KRISS), Republic of Korea
Dr. T. TIPLICA
University of Angers, France
Dr. P. ULBIG
PTB, Germany
Dr. Z. VINTR
University of Defence, Czech Republic
Dr. E. VUORINEN
National Metrology Institute, South Africa
Dr. S. YADAV
National Physical Laboratory, India
Dr. S. YONG WOO
Korea Research Institute of Standards and Sciences (KRISS), Republic of Korea
Editorial board