International Journal of Metrology and Quality Engineering (IJMQE) - Forthcoming
- Development and Characterization of a ZnO/Ge Photodiode for Optical Radiation Measurements in the Near Infrared
ZAHRA BENACHOUR
Accepted: 02/05/2017 - Thermal compensation for large volume metrology and structures
Bingru Yang, David Ross-Pinnock, Jody Muelaner and glen mullineux
Accepted: 25/01/2017