Open Access
Issue
Int. J. Metrol. Qual. Eng.
Volume 8, 2017
Article Number 13
Number of page(s) 12
DOI https://doi.org/10.1051/ijmqe/2017012
Published online 23 May 2017
  1. V. Kerzérho, P. Cauvet, S. Bernard, F. Azaïs, M. Renovell, M. Comte, Fully-efficient ADC test technique for ATE with low resolution arbitrary wave generators, in IMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, June (2007)
  2. T. Sundström, Design of high-speed analog-to-digital converters using low-accuracy components, Department of Electrical Engineering, Linköping University, Linköping, Sweden, 2011
  3. F. Azaïs, S. Bernard, Y. Bertrand, M. Comte, M. Renovell, Correlation between static and dynamic parameters of A-to-D converters: in the view of a unique test procedure, J. Electron. Test. 20, 375–387 (2004) [CrossRef]
  4. G. Roberts, F. Taenzler, M. Burns, An Introduction to Mixed-Signal IC Test and Measurement (Oxford University Press, 2000)
  5. B.E. Franklin, C.M. Akujuobi, W. Ali, ADC automated testing using LabView software, Center of Excellence for Communication Systems Technology Research (CECSTR), in Proceedings of the 2004 American Society for Engineering Education Annual, American Society for Engineering Education (2004)
  6. D. Haddadi, Test dynamique des convertisseurs analogiques numériques rapides: caractérisation par analyse temporelle, test industriel et considération instrumentales, Doctoral thesis, Graduate School of Physical Sciences and Engineering of Bordeaux I, France, 2002
  7. S. Cherubal, A. Chatterjee, Optimal linearity testing of analog-to-digital converters using a linear model, IEEE Trans. Circuits Syst. I: Fundam. Theory Appl. 50, 317–327 (2003) [CrossRef]
  8. B.E. Franklin, C.M. Akujuobi, W. Ali, ADC automated testing using LabView software, in Proceedings of the 2004 American Society for Engineering Education Annual (2004)
  9. F. Azaïs, S. Bertrand, Y. Bertrand, M. Renovell, Implementation of a linear histogram BIST for ADCs, in Proceedings of the Conference on Design, Automation and Test in Europe, Munich, Germany (2001)
  10. H.A. Hassan, I. Abdul-Halin, I. Bin-Aris, M.K. Bin-Hassan, Design of a low power 8-bit SAR-ADC CMOS, in Proceedings of Student Conference on Research and Development, SCOReD 2009, UPM Serdang, Malaysia (2009)
  11. Atmel AVR127: Understanding ADC Parameters, Application Note, 8456C-AVR-10, 2013, http://www.atmel.com/Images/Atmel-8456-8-and-32-bit-AVR-Microcontrollers-AVR127-Understanding-ADC-Parameters_Application-Note.pdf
  12. ADC Performance Parameters – Convert the Units Correctly!, Application Report, SLAA587, Texas Instruments, 2013, http://www.ti.com/
  13. R. Hedayati, A Study of Successive Approximation Registers and Implementation of an UltraLow Power 10-Bit SAR ADC in 65nm CMOS Technology, Master's thesis performed in Electronic Devices, 2011
  14. H. Khurramabadi, ADC Converters (Lecture 13), UC Berkeley Course, Analog-Digital Interfaces in VLSI Technology EE247, 2006
  15. L.G. Melkonian, Dynamic Specifications for Sampling A/D Converters, National Semiconductor Application, Note 769
  16. European Project DYNAD, Methods and Draft Standards for the DYNamic Characterization and Testing of Analog-to-Digital Converters, http://www.fe.up.pt/∼hsm/dynad/
  17. IEEE Standard for Digitizing Waveform Recorders, IEEE Std. 1057, 2007
  18. IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters, IEEE Std. 1241, 2010
  19. NI 6052E User Manual, Multifunction I/O Devices for PCI/PXI/1394 Bus Computers, http://www.ni.com/
  20. ADC080 × 8-Bit, μP-Compatible, Analog-to-Digital Converters, Texas Instruments, http://www.ti.com/
  21. S. Rapuano, Preliminary considerations on ADC standard harmonization, IEEE Trans. Instrum. Meas. 57, 386–394 (2008) [CrossRef]
  22. IEEE Std. 1241, Standard for Terminology and Test Methods for Analog-to-Digital Converters, 2000
  23. D. Petri, Frequency-domain testing of waveform digitizers, IEEE Trans. Instrum. Meas. 51, 445–453 (2002) [CrossRef]
  24. I. Benamrane, M. Hamine, Techniques de Test pour les convertisseurs analogiques/numériques, Department of Electrical Engineering, Polytechnical School of Montréal, Canada, 2004
  25. S. Bernard, Test intégré pour Convertisseurs Analogique/Numérique, Micro and nanotechnologies/Microelectronics, Université Montpellier II – Sciences et Techniques du Languedoc, 2001
  26. S. Renaud, Contribution à la caractérisation des circuits de conversion analogique numérique: conception et réalisation d'un système d'évaluation dynamique de ces dispositifs, Thèse de doctorat, Université de Bordeaux I, 1990
  27. R. Maghrebi, Contribution à la modélisation, conception et test de structures de conversion analogique numérique, Doctoral thesis, National Engineering School of Sfax, Tunisia, 2004

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