Open Access
Issue
Int. J. Metrol. Qual. Eng.
Volume 4, Number 2, 2013
Page(s) 71 - 80
DOI https://doi.org/10.1051/ijmqe/2013049
Published online 07 November 2013
  1. L.K. Chan, S.W. Cheng, F.A. Spiring, A New Measure of Process Capability: Cpm, J. Qual. Technol. 20, 162–175 (1998) [Google Scholar]
  2. W.L. Pearn, S. Kotz, N.L. Johnson, Distributional and inferential properties of process capability indices, J. Qual. Technol. 24, 216–231 (1992) [Google Scholar]
  3. K. Vännman, A unified approach to capability indices, Stat. Sin. 5, 805–820 (1995) [Google Scholar]
  4. K.S. Chen, W.L. Pearn, Capability indices for processes with asymmetric tolerances, J. Chin. Inst. Eng. 24, 559–568 (2001) [CrossRef] [Google Scholar]
  5. D. Grau, Process yield and capability indices, Commun. Stat. Theory Meth. 40, 2751–2771 (2011) [CrossRef] [Google Scholar]
  6. D. Grau, New Process capability indices for one-sided tolerances, Qual. Technol. Quant. Manag. 6, 107–124 (2009) [Google Scholar]
  7. D. Grau, Process yield, process centering, and capability indices for one-sided tolerance processes, Qual. Technol. Quant. Manag. 9, 153–170 (2012) [Google Scholar]
  8. H.J. Mittag, Measurement error effects on the performance of process capability indices, Front. Stat. Qual. Control 5, 195–206 (1997) [Google Scholar]
  9. W.L. Pearn, M.Y. Liao, Estimating and testing process precision with presence of gauge measurement errors, Qual. Quant. 41, 757–777 (2007) [CrossRef] [Google Scholar]
  10. W.L. Pearn, M.Y. Liao, Measuring process capability based on Cpk with gauge measurement errors, Microelectron. Reliab. 45, 739–751 (2005) [CrossRef] [Google Scholar]
  11. W.L. Pearn, M.Y. Liao, One-sided process capability assessment in the presence of measurement errors, Qual. Rel. Eng. Int. 22, 771–785 (2006) [CrossRef] [Google Scholar]
  12. W.L. Pearn, M.H. Shu, B.M. Hsu, Testing process capability based on Cpm in the presence of random measurement errors, J. Appl. Stat. 32, 1003–1024 (2005) [CrossRef] [Google Scholar]
  13. B.M. Hsu, M.H. Shu, W.L. Pearn, Measuring process capability based on Cpmk with gauge measurement errors, Qual. Rel. Eng. Int. 23, 597–614 (2007) [CrossRef] [Google Scholar]
  14. D. Grau, Lower confidence bound for capability indices with asymmetric tolerances and gauge measurement errors, Int. J. Qual. Eng. Technol. 2, 212–228 (2011) [CrossRef] [Google Scholar]
  15. D. Grau, Testing capability indices for manufacturing processes with asymmetric tolerance limits and measurement errors, Int. J. Metrol. Qual. Eng. 2, 61–73 (2011) [CrossRef] [EDP Sciences] [Google Scholar]

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