Open Access
Int. J. Metrol. Qual. Eng.
Volume 4, Number 2, 2013
Page(s) 81 - 86
Published online 07 November 2013
  1. C.-S. Kim, T.-K. Koo, Y.-D. Choi, Observation of an Interlayer in a Nano-Scale SiO2 Layer on Si Substrate by X-Ray Reflectivity (XRR) Analysis, Solid State Phenom. 124–126, 1689–1692 (2007) [CrossRef] [Google Scholar]
  2. C. Schug, B. York, J. Marien, H.-R. Blank, JCPDS-International Center for Diffraction Data 2001, Adv. X-Ray Anal. 44, 295–301 (2001) [Google Scholar]
  3. G. Friedbacher, P.K. Hansma, D. Schwarzbach, M. Grasserbauer, H. Nickel, Investigation of aluminum gallium arsenide/gallium arsenide superlattices by atomic force microscopy, Anal. Chem. 64, 1760–1762 (1992) [CrossRef] [Google Scholar]
  4. D.G. Rickerby, T. Friesen, Microstructural examination of layered coatings by scanning electron microscopy, transmission electron microscopy, and atomic force microscopy, Mater. Charact. 36, 213–223 (1996) [CrossRef] [Google Scholar]
  5. D.K. Bowen, M. Wormington, Characterization of materials by grazing-incidence X-ray scattering, Adv. X-Ray Anal. 36, 171 (1993) [CrossRef] [Google Scholar]
  6. K.N. Stoev, K. Sakurai, Review on grazing incidence X-ray spectrometry and reflectometry, Spectrochim. Acta Part B 54, 41 (1999) [CrossRef] [Google Scholar]
  7. T.C. Chen, C.-Y. Peng, C.-H. Tseng, M.-H. Liao, M.-H. Chen, C.-I. Wu, M.-Y. Chern, P.-J. Tzeng, C.W. Liu, Characterization of the Ultrathin HfO2 and Hf-Silicate Films Grown by Atomic Layer Deposition, IEEE Trans. Electron Devices 54, 759–766 (2007) [CrossRef] [Google Scholar]
  8. L. Ren, J. Cui, The Angle Traceablity of X-ray Diffraction, Metrol. Technol. 3, 48–51 (2012) [Google Scholar]
  9. L. Ren, H. Gao, The X-ray Wavelength Traceablity of X-ray Diffraction, Metrol. Technol. 12, 3–4 (2012) [Google Scholar]
  10. W. Xia, B.A. Minch, M.D. Carducci, N.R. Armstrong, LB films of rodlike phthalocyanine aggregates: Specular X-ray reflectivity studies of the effect of interface modification on coherence and microstructure, Langmuir 20, 7998–8005 (2004) [CrossRef] [PubMed] [Google Scholar]
  11. F. Cecchet, B. De Meersman, S. Demoustier-Champagne, B. Nysten, A.M. Jonas, One step growth of protein antifouling surfaces: monolayers of poly (ethylene oxide)(PEO) derivatives on oxidized and hydrogen-passivated silicon surfaces, Langmuir 22, 1173–1181 (2006) [CrossRef] [PubMed] [Google Scholar]
  12. S. Basu, S.K. Satija, In-situ X-ray Reflectivity Study of Alkane Films Grown from the Vapor Phase, Langmuir 23, 8331–8335 (2007) [CrossRef] [PubMed] [Google Scholar]
  13. C.R. Hansen, T.J. Sørensen, M. Glyvradal, J. Larsen, S.H. Eisenhardt, T. Bjørnholm, M.M. Nielsen, R. Feidenhans’l, B.W. Laursen, Structure of the Buried Metal-Molecule Interface in Organic Thin Film Devices, Nano Lett. 9, 1052–1057 (2009) [CrossRef] [PubMed] [Google Scholar]
  14. W.H. Briscoe, M. Chen, I.E. Dunlop, J. Klein, J. Penfold, R.M.J. Jacobs, Applying grazing incidence X-ray reflectometry (XRR) to characterising nanofilms on mica, J. Coll. Interf. Sci. 306, 459–463 (2007) [CrossRef] [Google Scholar]
  15. O. Durand, V. Berger, R. Bisaro, A. Bouchier, A. De Rossi, X. Marcadet, I. Prevot, Determination of thicknesses and interface roughnesses of GaAs-based and InAs/AlSb-based heterostructures by X-ray reflectometry, Mater. Sci. Semicond. Process. 4, 327–330 (2001) [CrossRef] [Google Scholar]
  16. A. Gibaud, S. Hazra, X-ray reflectivity and diffuse scattering, Curr. Sci. 78, 1467–1477 (2000) [Google Scholar]
  17. Rusli, K. Chew, S.F. Yoon, H.K. Chan, C.F. Ng, Q. Zhang, J. Ahn, Determination of Properties of Thin Films Using X-ray Reflectivity, Int. J. Mod. Phys. B 16, 1072 (2002) [CrossRef] [Google Scholar]
  18. L.G. Parratt, Surface Studies of Solids by Total Reflection of X-Rays, Phys. Rev. 95, 395–369 (1954) [Google Scholar]
  19. H. Quan, Y.Z. Han, Reference Materials and Their Applications, 2nd edn. (Chinese Standard Press, Beijing, 2003) [Google Scholar]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.