The ITS-90 after definition of neon isotopic reference composition: extent of the isotopic effect tested on previous inter-comparison results | International Journal of Metrology and Quality Engineering (IJMQE)

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Table 1

Typical and aimed uncertainty budget for cryogenic fixed point measurements [3].

#	Item	Typical 1975‑2000 (μK)	Available in 2006 (μK)	Aimed in future (μK)
1	Non-isotopic impurities	50 ⇒ 2000⁴	40	10
2	Isotopic composition	Up to 700⁵	30⁶	20
3	Induced by R_cs	50–200	30	10
4	Induced by τ	<100	20	10
5	Cryostat other effects¹	20–300	10	10
6	Resistance measurement²	30–200	30	10⁷
7	T_tp definition³	20–300	20	0

	Total	150–1000	70	30

Legend: R_cs = static thermal resistance; τ = cell dynamic time constant; T_tp = triple point temperature.

¹ For meltings lasting less than ≈12 h. ² Except with e-H₂ when measuring a CSPRT. ³ For ΔT_{melt(20–80%)} < ≈0.1 mK. ⁴ For Ar in O₂ or HD in D₂. ⁵ For D in H. ⁶ For the best assay uncertainty only. ⁷ Equivalent to ≈1 μΩ for a SPRT above 40 K.

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