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Cited article:

Determination of multilayer thicknesses of GaAs/AlAs superlattice by grazing incidence X-ray reflectivity

L.L. Ren, H.F. Gao, S.T. Gao, J.J. Liu, W. Zhang

Int. J. Metrol. Qual. Eng., 4 2 (2013) 81-86

Published online: 2013-11-07

DOI: https://doi.org/10.1051/ijmqe/2013040

This article has been cited by the following article(s):

The thickness measurement of ultrathin films from new high-kmaterial HfO2by grazing incidence x-ray reflectivity

Yabin Jia, Huifang Gao, Xu Li, et al.
Materials Research Express 3 (6) 065015 (2016)
DOI: 10.1088/2053-1591/3/6/065015
See this article