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This article has been cited by the following article(s):
Hard X-ray resonant reflectivity studies of ultrathin WS2 layers grown by pulsed laser deposition
Sergey M. Suturin, Polina A. Dvortsova, Alexander M. Korovin, Vladimir V. Fedorov, Evgeniya Yu. Lobanova and Nikolai S. Sokolov Journal of Semiconductors 46(3) 032701 (2025) https://doi.org/10.1088/1674-4926/24080040
Intellectual fitting of hard X-ray resonant reflectance maps obtained for low-contrast oxide multilayers across L absorption edges of Eu and Gd