Fig. 3
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Schematics of a cone-beam X-ray CT setup with a flat panel detector (left) and the two-stage magnification architecture of a ZEISS Versa 3D X-ray microscope (right) with tunable objectives of different optical magnifications and a 0.4× (faint colored) macro-lens. The Combination of geometric and optical magnification enables higher resolution capabilities in XRMs as compared to flat panel X-ray CT systems.
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