| Issue |
Int. J. Metrol. Qual. Eng.
Volume 3, Number 1, 2012
|
|
|---|---|---|
| Page(s) | 55 - 62 | |
| DOI | https://doi.org/10.1051/ijmqe/2012002 | |
| Published online | 26 September 2012 | |
Evaluation of metrology technologies for free form surfaces
1
Centro de Innovación en Diseño y Tecnología, Tecnológico de
Monterrey, Av. Eugenio Garza Sada
#2501, 64849
Monterrey,
Mexico
2
Department of Mechanical Engineering, Technical University of
Denmark, 2800
Kgs. Lyngby,
Denmark
⋆ Correspondence: hector.siller@itesm.mx
Received:
21
July
2011
Accepted:
24
March
2012
This research work describes a novel approach for comparing different technologies for free form surface metrology: computerized tomography (CT), photogrammetry and coordinate measuring machines (CMM). The comparison has the aim of providing relevant information for the selection of metrology equipment when measuring free form components. Results demonstrate that there is the imperative need to assess the uncertainty and reproducibility of CT and photogrammetry measurements by applying some calibration procedures taking into account some recommendations for work piece alignment. This article also deals with costs issues, required standards, and necessary additional information when selecting inspection equipment.
Key words: Freeform / metrology / computed tomography / CMM / photogrammetry
© EDP Sciences 2012
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