A comparison of some NDE techniques according to detectable defect location and achievable spatial resolution (left) and typical spatial resolutions achievable by different CT techniques as a function of the FOV diameter (right), highlighting relevant technologies used for dimensional metrology, including synchrotron CT with Kirkpatrick–Baez (KB) mirrors, and focused ion beam tomography (FIBT). Adapted from reference [2], with diagrams that are drawn only for conceptual illustration.