Issue |
Int. J. Metrol. Qual. Eng.
Volume 8, 2017
|
|
---|---|---|
Article Number | 30 | |
Number of page(s) | 15 | |
DOI | https://doi.org/10.1051/ijmqe/2017024 | |
Published online | 15 December 2017 |
Research Article
Traceability validation of a high speed short-pulse testing method used in LED production
VSL BV, Dutch Metrology Institute,
Thijsseweg 11,
2629JA
Delft, Netherlands
* Corresponding author: rewtowa@gmail.com
Received:
22
August
2017
Accepted:
6
November
2017
Industrial processes of LED (light-emitting diode) production include LED light output performance testing. Most of them are monitored and controlled by optically, electrically and thermally measuring LEDs by high speed short-pulse measurement methods. However, these are not standardized and a lot of information is proprietary that it is impossible for third parties, such as NMIs, to trace and validate. It is known, that these techniques have traceability issue and metrological inadequacies. Often due to these, the claimed performance specifications of LEDs are overstated, which consequently results to manufacturers experiencing customers' dissatisfaction and a large percentage of failures in daily use of LEDs. In this research a traceable setup is developed to validate one of the high speed testing techniques, investigate inadequacies and work out the traceability issues. A well-characterised short square pulse of 25 ms is applied to chip-on-board (CoB) LED modules to investigate the light output and colour content. We conclude that the short-pulse method is very efficient in case a well-defined electrical current pulse is applied and the stabilization time of the device is “a priori” accurately determined. No colour shift is observed. The largest contributors to the measurement uncertainty include badly-defined current pulse and inaccurate calibration factor.
Key words: high speed short-pulse method / LED packages and modules / CoB LED module / SSL product / colour shift / electrical pulse characteristics / direct current (DC) / traceability / temperature dependency
© E. Revtova et al., published by EDP Sciences, 2017
This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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