Int. J. Metrol. Qual. Eng.
Volume 4, Number 2, 2013
|Page(s)||121 - 125|
|Published online||07 November 2013|
Line scale measurement using image registration
National Institute of Metrology, Quality and Technology (INMETRO), Av. Nossa Senhora das Graças
25250-020, Duque de
Caxias - RJ,
2 Mechanical Engineering Post-Graduation Program, Universidade Federal Fluminense (UFF), Rua Passo da Patria 156, CEP 24210-240, Niterói - RJ, Brazil
3 Mechanical Engineering Post-Graduation Program, Universidade Federal do Paraná (UFPR), Jardim das Américas, CEP 81531-990, Curitiba - PR, Brazil
⋆ Correspondence: email@example.com
Received: 28 March 2013
Accepted: 16 July 2013
Currently, most advances in dimensional metrology might be seen by the evolution of non-contact measurement (optical measurements), in order to provide traceability for different areas that needs to calibrate microscopes or optical measure machines. In a similar way, the use of image processing techniques for the measuring of objects has been the subject of recent studies in computer vision and image metrology. In the attempt to meet the requirements and demands for high accuracy dimensional metrology with image processing techniques, this work will present the application of the image registration technique for the measurement of line scales. In the conventional calibration, the scales are measured in pre-established points, generally in intervals of 10% of the total scale length. With this application, it becomes possible to provide results for all the scale marks quickly and automatically, whereas in the conventional method it would require more time and, thus, a higher cost for the fulfillment of this measurement.
Key words: Dimensional metrology / line scale / image processing / image registration
© EDP Sciences 2013
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