Importance and estimation of mismatch uncertainty for RF parameters in calibration laboratories

¹ Amorphous and Microcrystalline Silicon Solar Cells, CSIR-National Physical Laboratory, New Delhi, India
² Electrical Standards, CSIR-National Physical Laboratory, New Delhi, India

^⋆ Correspondence: kpatel@nplindia.org

Received: 17 March 2012
Accepted: 24 March 2012

Abstract

A number of calibration techniques are used in Radio Frequency (RF) calibration for power, attenuation and impedance parameters. Mismatch uncertainty plays a major role in these measurements and in estimation of combined uncertainty according to ISO/IEC 17025:2005 and GUM document. Formulas to evaluate the mismatch uncertainty in terms of reflection coefficient, voltage standing wave ratio and scattering parameters have been evaluated earlier and are being used in RF calibration. The present paper summarizes the mismatch formulas previously studied and the modified ones suitable to the measurement system and techniques available today. For power and attenuation calibration in the particular frequency range, an establishment of traceability for one-port measurement in the same frequency range is required. The methods to reduce and control this uncertainty component and their limitations are also discussed forbest measurements practices in the calibration laboratories.