Ultra-high precision CMMs and their associated tactile or/and optical scanning probesH. Nouira, R.H. Bergmans, A. Küng, H. Piree, R. Henselmans and H.A.M. SpaanInt. J. Metrol. Qual. Eng., 5 2 (2014) 204DOI: https://doi.org/10.1051/ijmqe/2014009
