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Ultra-high precision CMMs and their associated tactile or/and optical scanning probes

H. Nouira, R.H. Bergmans, A. Küng, H. Piree, R. Henselmans and H.A.M. Spaan

Int. J. Metrol. Qual. Eng., 5 2 (2014) 204

DOI: https://doi.org/10.1051/ijmqe/2014009

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