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Measurement Science and Technology 29 (10) 105002 (2018)
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In situ temperature calibration for critical applications near ambient

E Webster, David Clarke, Ross Mason, Peter Saunders and D Rod White
Measurement Science and Technology 31 (4) 044006 (2020)
DOI: 10.1088/1361-6501/ab5dd1
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Modelling of thermal effects in a slim tin fixed-point cell

Sergio A. Carvajal, J. Herney Ramírez, Andrés J. Bohórquez and Ciro A. Sánchez
International Journal of Metrology and Quality Engineering 10 17 (2019)
DOI: 10.1051/ijmqe/2019017
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