International Journal of Metrology and Quality Engineering (IJMQE)

Ultra-high precision CMMs and their associated tactile or/and optical scanning probes

H. Nouira, R.H. Bergmans, A. Küng, H. Piree, R. Henselmans and H.A.M. Spaan

Int. J. Metrol. Qual. Eng., 5 2 (2014) 204

Published online: 09 October 2014

DOI: 10.1051/ijmqe/2014009

H. Nouira

R.H. Bergmans

A. Küng

H. Piree

R. Henselmans

H.A.M. Spaan

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)