International Journal of Metrology and Quality Engineering (IJMQE)

Optimization of accelerated testing through design of experiment for ageing of lead-free electronic interconnection material

M. Catelani, V.L. Scarano and R. Berni

Int. J. Metrol. Qual. Eng., 4 1 (2013) 47-54

Published online: 05 June 2013

DOI: 10.1051/ijmqe/2012037

M. Catelani

V.L. Scarano

R. Berni

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