International Journal of Metrology and Quality Engineering (IJMQE)

The yield estimation of semiconductor products based on truncated samples

K. Gu, X.Z. Jia, H.L. You and T. Liang

Int. J. Metrol. Qual. Eng., 4 3 (2013) 215-220

Published online: 06 March 2014

DOI: 10.1051/ijmqe/2013050

K. Gu

X.Z. Jia

H.L. You

T. Liang

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