International Journal of Metrology and Quality Engineering (IJMQE) - Forthcoming

  • Development and Characterization of a ZnO/Ge Photodiode for Optical Radiation Measurements in the Near Infrared
    ZAHRA BENACHOUR
    Accepted: 02/05/2017
  • Thermal compensation for large volume metrology and structures
    Bingru Yang, David Ross-Pinnock, Jody Muelaner and glen mullineux
    Accepted: 25/01/2017