Extending the measurement capabilities of 3D X-ray microscopy to dimensional metrology
Int. J. Metrol. Qual. Eng., 15 (2024) 5
Published online: 2024-03-29
Articles citing this article
The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
This article has been cited by the following article(s):
Magnification calibration of X-ray 3D microscopy using micro-line structures
Yasushi Azuma, Kazuhiro Kumagai, Naoki Kunishima and Koichiro ItoMicroscopy 74 (1) 48 (2025)
https://doi.org/10.1093/jmicro/dfae045
Scale correction in submicron computed tomography with a submillimeter field of view
Marek Zemek, Pavel Blažek, Jakub Šalplachta, Tomáš Zikmund, Michal Petřík, Robert H. Schmitt and Jozef KaiserTomography of Materials and Structures 7 100054 (2025)
https://doi.org/10.1016/j.tmater.2025.100054
1 (2025)
https://doi.org/10.1109/ICISCN64258.2025.10934177