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Cited article:

Quantification via X‐ray fluorescence analysis of oxygen in the surface layer of a Si‐sphere used as a new mass standard

Yu‐Hsin Wu, Lin Tsao, Jeng‐Yu Chiu, Sheng‐Jui Chen, Rolf Fliegauf, Matthias Müller, Edyta Beyer and Michael Kolbe
X-Ray Spectrometry 51 (2) 122 (2022)