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Cited article:

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Izmeritel`naya Tekhnika 74 (2) 37 (2025)
https://doi.org/10.32446/0368-1025it.2025-2-37-46

Modified short-run statistical process control for test and measurement process

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The International Journal of Advanced Manufacturing Technology 100 (5-8) 1531 (2019)
https://doi.org/10.1007/s00170-018-2776-1

An overview of Quality Management System implementation in a research laboratory

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International Journal of Metrology and Quality Engineering 9 2 (2018)
https://doi.org/10.1051/ijmqe/2017025

Modified SPC for short run test and measurement process in multi-stations

C K Koh, J F Chin and S Kamaruddin
IOP Conference Series: Materials Science and Engineering 328 012009 (2018)
https://doi.org/10.1088/1757-899X/328/1/012009

Critical analysis of the acceptance criteria used in measurement systems evaluation

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International Journal of Metrology and Quality Engineering 8 23 (2017)
https://doi.org/10.1051/ijmqe/2017016

Smart metrology: the importance of metrology of decisions in the big data era

Annarita Lazzari, Jean-Michel Pou, Christophe Dubois and Laurent Leblond
IEEE Instrumentation & Measurement Magazine 20 (6) 22 (2017)
https://doi.org/10.1109/MIM.2017.8121947