A possible legal metrology framework for traceability of nano-scale dimensional measurements (Reg 17 certificates of verification of Australian primary and secondary standards of measurement; Reg 21 Recognition of foreign reference standards of measurement; Reg 37 certification of measuring instruments; Reg 48 Certification of reference materials; Reg 53 Recognition of foreign reference materials; Reg 60 Approval of patterns of measuring instruments (National Measurement Regulations 1999 cth)).