International Journal of Metrology and Quality Engineering (IJMQE)

Extending the measurement capabilities of 3D X-ray microscopy to dimensional metrology

Herminso Villarraga-Gómez, Naomi Kotwal and Robert Zarnetta

Int. J. Metrol. Qual. Eng., 15 (2024) 5

Published online: 29 March 2024

DOI: 10.1051/ijmqe/2024002

Herminso Villarraga-Gómez

Naomi Kotwal

Robert Zarnetta

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