International Journal of Metrology and Quality Engineering (IJMQE)

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The yield estimation of semiconductor products based on truncated samples

K. Gu, X.Z. Jia, H.L. You and T. Liang

Int. J. Metrol. Qual. Eng., 4 3 (2013) 215-220

Published online: 06 March 2014

DOI: 10.1051/ijmqe/2013050

K. Gu

X.Z. Jia

H.L. You

T. Liang

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